| Título | Statistical analysis of nanoimpact testing of hard CrAl(Si)N coatings |
|---|---|
| Autores | Mosquera A. , Mera L. , Fox-Rabinovich G.S. , Martínez A. , Azkona I. , ENDRINO ARMENTEROS, JOSÉ LUIS |
| Publicación externa | Si |
| Medio | Mater Res Soc Symp Proc |
| Alcance | Conference Paper |
| Naturaleza | Científica |
| Impacto SJR | 0.155 |
| Web | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84860166138&doi=10.1557%2fopl.2011.1204&partnerID=40&md5=911aef7aebac343a3d4584bb6fbb5622 |
| Fecha de publicacion | 01/01/2011 |
| Scopus Id | 2-s2.0-84860166138 |
| DOI | 10.1557/opl.2011.1204 |
| Abstract | Statistical studies involving the fracture behavior of coatings can play an important role in the mechanical analysis of films employed in the hard coating industry. In this study, Nanoimpact tests using a cube corner indenter were carried out in various CrAl(Si)N coatings for the quantitative assessment of properties of coatings like non-catastropic failure time and catastrophic failure time. These parameters decrease in value as silicon is incorporated in coatings, showing that this addition results in a decrease in ductility. Scanning electron microscope images were taken to the analyzed coatings exhibiting the residual imprints after nanoimpact test that were correlated with the fracture behavior of CrAl(Si)N coatings. © 2011 Materials Research Society. |
| Palabras clave | Catastrophic failures; Cathodic arc evaporation; Coating industry; CrAlSiN; Failure time; Fracture behavior; Indenters; Mechanical analysis; Nano-impact testing; Nanoimpact; Properties of coatings; Quantitative assessments; Residual imprint; Scanning Electron Microscope; Statistical study; Fracture; Scanning electron microscopy; Silicon; Hard coatings |
| Miembros de la Universidad Loyola |